This process is experimental and the keywords may be updated as the learning algorithm improves. Export datapoint and circle info to ASCII-file for post-processing in spreadsheets or math. Circles and contours for stability, noise figure, gain, VSWR and Q. These keywords were added by machine and not by the authors. Matching ladder networks with capacitors, inductors, resistors, serie and parallel RLC, transformers, serie lines and open or shorted stubs. Each of these can be calculated from the other and each has advantages under different circumstances. XRD with PDF Double-Y Before-After Plot Pie Chart from Categorical Data. The magnitude and phase of these waves can be expressed as S-parameters (scattering parameters), Z-parameters (impedance parameters), Y-parameters (admittance parameters), or reflection coefficient. Spider Plot/Radar Chart Smith Charts Stiff Diagram Durov Plot Zoom Plot. In addition to measuring the magnitude of the incident and reflected wave, the phase difference between the two waves can also be measured. Unlike a DC measurement where only one voltage can be extracted from a given point on a line, microwave measurements can isolate a forward-moving voltage wave from a backward-moving wave using directional couplers.
Reflection coefficient is the ratio of a reflected voltage wave divided by an incident wave. This chart is fundamentally admittance and/or impedance scales overlaid on a polar plot of voltage reflection coefficient Γ versus frequency. Smith developed a chart that is still a key tool in microwave work and is heavily used in this book.
